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Frederick M. Tesche
author size: 16
USD
358.04
price size: 16
AussieBookSeller /Abebooks AUS
dealer size: 16
ISBN10: 047115573X, ISBN13: 9780471155737, [publisher: John Wiley & Sons Inc, New York] Hardcover First Edition Hardcover. Describes and illustrates various modeling techniques which are applicable to the area of EMC and includes material previously available only in international reports or other hard-to-obtain references. Electromagnetic topology, lumped-parameter circuit models, the radiation process, scalar diffraction theory for apertures, transmission line modeling, and models for shielding are among the topics discussed. The accompanying disk contains four programs based on the models developed in the text and can be used to calculate diverse transmission line responses. Recent progress in numerical computation has permitted the creation of models that help explain electromagnetic (EM) interference, predict and mitigate its effect, and offer an approach to solving electromagnetic compatibility (EMC) problems. This book describes the formulation, development, analysis, and use of EMC models. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
[Truganina, VIC, Australia] [Publication Year: 1997]
description size: 16
Tesche, Frederick M., Ianoz, Michel, Karlsson, Torbjörn
USD
361.40
dsmbooks /AbebooksUK
ISBN10: 047115573X, ISBN13: 9780471155737, [publisher: Wiley-Interscience] Hardcover Like New
[liverpool, United Kingdom] [Publication Year: 1996]

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