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ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: Wiley-VCH] Hardcover First Edition Condition: Good. Hard cover, no jacket. Ex-university library copy with associated library stamps etc. 333pp. No highlighting or annotations to text. A clean, tight copy - possibly unread. Photo on request. [Derbyshire, United Kingdom] [Publication Year: 1998]
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: Wiley & Sons, Incorporated, John] Hardcover Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects. [Mishawaka, IN, U.S.A.] [Publication Year: 1997]
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: Wiley & Sons, Incorporated, John] Hardcover Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects. [Mishawaka, IN, U.S.A.] [Publication Year: 1997]
Wiley & Sons, Incorporated, John. Used - Very Good. Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects. Wiley & Sons, Incorporated, John ISBN 0471194581 9780471194583 [US]
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: Wiley] Hardcover Gently used book with ongoing seller support until you're fully satisfied with your purchase. [Del Rio, TN, U.S.A.] [Publication Year: 1997]
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: Wiley-VCH] Hardcover New. Fast Shipping and good customer service [Fayetteville, TX, U.S.A.] [Publication Year: 1997]
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: John Wiley & Sons] Hardcover VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California.RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.DEANE K. SMITH is a professor emeritus in the Department of Geosciences . [Greven, Germany] [Publication Year: 1998]
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: Wiley-VCH] Hardcover Very Good condition. Shows only minor signs of wear, and very minimal markings inside (if any). [Tucson, AZ, U.S.A.] [Publication Year: 1997]
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: Wiley-Blackwell] Hardcover New Book. Shipped from UK. Established seller since 2000. [Fairford, GLOS, United Kingdom] [Publication Year: 1998]
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: John Wiley & Sons] Hardcover VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California.RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.DEANE K. SMITH is a professor emeritus in the Department of Geosciences . [Greven, Germany] [Publication Year: 1998]
Wiley-Blackwell 2/17/1998 12: 00: 00 AM Hardcover PLEASE NOTE, WE DO NOT SHIP TO DENMARK. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK.
Wiley-Blackwell 2/17/1998 12: 00: 00 AM Hardcover PLEASE NOTE, WE DO NOT SHIP TO DENMARK. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK.
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: John Wiley and Sons Ltd] Hardcover First Edition X-ray fluorescence (XRF) and x-ray diffraction (XRD) are analytical techniques used to identify substances by examining the amount of energy given off from a substance during an x-ray. The most common errors in XRF analysis and XRD usually occur during preparation of the specimen. Editor(s): Buhrke, Victor E.; Jenkins, Ron; Smith, Deane K. Num Pages: 360 pages, bibliography. BIC Classification: MQH; PNFS. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 243 x 223 x 25. Weight in Grams: 702. . 1997. 1st Edition. Hardcover. . . . . [Galway, GY, Ireland] [Publication Year: 1997]
ISBN10: 0471194581, ISBN13: 9780471194583, [publisher: John Wiley and Sons Ltd] Hardcover X-ray fluorescence (XRF) and x-ray diffraction (XRD) are analytical techniques used to identify substances by examining the amount of energy given off from a substance during an x-ray. The most common errors in XRF analysis and XRD usually occur during preparation of the specimen. Editor(s): Buhrke, Victor E.; Jenkins, Ron; Smith, Deane K. Num Pages: 360 pages, bibliography. BIC Classification: MQH; PNFS. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 243 x 223 x 25. Weight in Grams: 702. . 1997. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland. [Olney, MD, U.S.A.] [Publication Year: 1997]
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When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission at no extra cost to you. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network, Amazon and Alibris.
