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The dream was always running ahead of me. To catch up, to live for a moment in unison with it, that was the miracle.
John Wiley & Sons, Date: 2006. Hardcover. Like New. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed. 2006. John Wiley & Sons ISBN 0471784060 9780471784067 [US]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: Wiley-IEEE Press] Hardcover Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less 1.75 [Dallas, TX, U.S.A.] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: Wiley-IEEE Press] Hardcover Buy with confidence! Book is in good condition with minor wear to the pages, binding, and minor marks within [Amherst, NY, U.S.A.] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: Wiley-IEEE Press] Hardcover Very Good condition. Shows only minor signs of wear, and very minimal markings inside (if any). [Tucson, AZ, U.S.A.] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: Wiley-IEEE Press] Hardcover Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc. [Montgomery, IL, U.S.A.] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons] Hardcover GARY S. MAY, PhD, is Professor in the School of Electrical and Computer Engineering at the Georgia Institute of Technology. Dr. May is a Fellow of the IEEE and Senior Member of the Society of Manufacturing Engineers. He has published more than 150 articles . [Greven, Germany] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: Wiley-Blackwell] Hardcover New Book. Shipped from UK. Established seller since 2000. [Fairford, GLOS, United Kingdom] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons] Hardcover GARY S. MAY, PhD, is Professor in the School of Electrical and Computer Engineering at the Georgia Institute of Technology. Dr. May is a Fellow of the IEEE and Senior Member of the Society of Manufacturing Engineers. He has published more than 150 articles . [Greven, Germany] [Publication Year: 2006]
Wiley-Blackwell 6/16/2006 12: 00: 00 AM Hardcover PLEASE NOTE, WE DO NOT SHIP TO DENMARK. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK.
Hardback. New. Fundamentals of Semiconductor Manufacturing and Process Control examines in detail the methodology by which electronic materials and supplies are converted into finished integrated circuits, and electronic products in a high-volume manufacturing environment. ISBN 0471784060 9780471784067 [GB]
Wiley-Blackwell 6/16/2006 12: 00: 00 AM Hardcover PLEASE NOTE, WE DO NOT SHIP TO DENMARK. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK.
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: Wiley-IEEE Press] Hardcover 100% Customer Satisfaction Guaranteed ! The book shows some signs of wear from use but is a good readable copy. Cover in excellent condition. Binding tight. Pages in great shape, no tears. Not contain access codes, cd, DVD. [Suffolk, United Kingdom] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: Wiley-IEEE Press] Hardcover Book is in NEW condition. Satisfaction Guaranteed! Fast Customer Service!! [Suffolk, United Kingdom] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons Inc] Hardcover New copy - Usually dispatched within 4 working days. [Southport, United Kingdom] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons Inc, Chichester] Hardcover First Edition Hardcover. A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and s ...
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley and Sons Ltd] Hardcover First Edition Fundamentals of Semiconductor Manufacturing and Process Control examines in detail the methodology by which electronic materials and supplies are converted into finished integrated circuits, and electronic products in a high-volume manufacturing environment. Num Pages: 488 pages, Illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 166 x 25. Weight in Grams: 776. . 2006. 1st Edition. Hardcover. . . . . [Galway, GY, Ireland] [Publication Year: 2006]
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons Inc, Chichester] Hardcover First Edition Hardcover. A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and s ...
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons Inc, Chichester] Hardcover First Edition Hardcover. A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and s ...
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley and Sons Ltd] Hardcover Fundamentals of Semiconductor Manufacturing and Process Control examines in detail the methodology by which electronic materials and supplies are converted into finished integrated circuits, and electronic products in a high-volume manufacturing environment. Num Pages: 488 pages, Illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 166 x 25. Weight in Grams: 776. . 2006. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland. [Olney, MD, U.S.A.] [Publication Year: 2006]
DISCLOSURE:
When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission at no extra cost to you. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network, Amazon and Alibris.