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Our search for Keyword: 0792305361 ,ISBN: 0792305361, brought up 10 title(s), showing 1 - 10. 6 removed. Sorting by Price Ascending.
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Christou, A. [Editor]; Unger, B.A. [Editor];
author size: 16
USD
252.43
price size: 16
GridFreed via Alibris /Alibris
dealer size: 16
Springer 1989-12-31 1990 ed. Hardcover New Size: 9x6x1; New. In shrink wrap. Looks like an interesting title!
description size: 16
N/A
USD
252.43
BennettBooksLtd /Abebooks
ISBN10: 0792305361, ISBN13: 9780792305361, [publisher: Springer] Hardcover New. In shrink wrap. Looks like an interesting title! 2.21
[North Las Vegas, NV, U.S.A.] [Publication Year: 1989]
Christou A. Editor; Unger BA. Editor; B. A.
USD
265.05
GridFreed LLC /Biblio
Springer, Date: 1989-12-31. Hardcover. New. New. In shrink wrap. Looks like an interesting title! 1989. Springer ISBN 0792305361 9780792305361 [US]
Christou, A (Editor), and Unger, B a (Editor)
USD
309.99
Alibris /Alibris
Dordrecht Springer 1989 1990 ed. Hard cover New. Sewn binding. Cloth over boards. 575 p. NATO Science Series E:, 175.
N/A
USD
318.29
booksXpress /Abebooks
ISBN10: 0792305361, ISBN13: 9780792305361, [publisher: Springer] Hardcover
[Bayonne, NJ, U.S.A.] [Publication Year: 1989]
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B. A. Unger
USD
324.84
AHA-BUCH GmbH /ZVAB
ISBN10: 0792305361, ISBN13: 9780792305361, [publisher: Springer Netherlands] Hardcover Druck auf Anfrage Neuware - Printed after ordering - This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
[Einbeck, Germany] [Publication Year: 1989] ...
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N/A
USD
344.52
Lucky's Textbooks /Abebooks
ISBN10: 0792305361, ISBN13: 9780792305361, [publisher: Springer] Hardcover
[Dallas, TX, U.S.A.] [Publication Year: 1989]
Aris Christou
USD
348.32
Ria Christie Collections /Biblio
Hard Cover. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The Semiconductor Device Reliability. ISBN 0792305361 9780792305361 [GB]
B. A. Unger
USD
358.00
AHA-BUCH GmbH /AbebooksDE
ISBN10: 0792305361, ISBN13: 9780792305361, [publisher: Springer Netherlands] Hardcover Druck auf Anfrage Neuware - Printed after ordering - This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
[Einbeck, Germany] [Publication Year: 1989] ...
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Christou A. Editor; Unger BA. Editor; B. A.
USD
431.00
SOUTHAUSTRALIANBOOKS /Biblio
Springer. Hardcover. New. 9x6x1. Springer ISBN 0792305361 9780792305361 [US]

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