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Our search for Keyword: 9780819419347 ,ISBN: 9780819419347, brought up 15 title(s), showing 1 - 15. 2 removed. Sorting by Price Ascending.
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Stover John C.
author size: 16
USD
24.95
price size: 16
Florida Mountain Book Co. /Biblio
dealer size: 16
Bellingham, WA: SPIE Optical Engineering Press, Date: 1995. Hardcover, [xiii], 321 pages. Near Fine condition. Second edition. Size 10.25"x7.25". "As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable." Book has very light exterior shelfwear, else As New, clean and unmarked.. Near Fine. 1995. SPIE Optical Engineering Press ISBN 0819419346 9780819419347 [US]
description size: 16
Stover, John C.
USD
24.95
Florida Mountain Book Co. /Abebooks
ISBN10: 0819419346, ISBN13: 9780819419347, [publisher: SPIE Optical Engineering Press, Bellingham, WA] Hardcover Hardcover, [xiii], 321 pages. Near Fine condition. Second edition. Size 10.25"x7.25". "As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable." Book has very light exterior shelfwear, else As New, clean and unmarked.
[Datil, NM, U.S.A.] [Publication Year: 1995]
Stover, John C.
USD
28.19
ThriftBooks-Dallas via Alibris /Alibris
SPIE-International Society for Optical Engine 1995 2nd ed. Hardcover Very good May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
Stover, John C.
USD
28.19
ThriftBooks-Dallas via Alibris /Alibris
SPIE-International Society for Optical Engine 1995 2nd ed. Hardcover Very good May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
John C. Stover
USD
28.20
HPB-Emerald via Alibris /Alibris
SPIE Publications 1995 2nd ed. hardcover Very good Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!
John C. Stover
USD
28.20
HPB-Emerald /Abebooks
ISBN10: 0819419346, ISBN13: 9780819419347, [publisher: SPIE Publications] Hardcover Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!
[Dallas, TX, U.S.A.] [Publication Year: 1995]
John C. Stover
USD
32.17
SecondSale /Abebooks
ISBN10: 0819419346, ISBN13: 9780819419347, [publisher: SPIE Publications] Hardcover Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.
[Montgomery, IL, U.S.A.] [Publication Year: 1995]
John C. Stover
USD
32.19
ThriftBooks /Biblio
SPIE, Date: 1995. Hardcover. Very Good. Disclaimer:May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed. 1995. SPIE ISBN 0819419346 9780819419347 [US]
Stover, John C.
USD
32.19
ThriftBooks-Dallas /Abebooks
ISBN10: 0819419346, ISBN13: 9780819419347, [publisher: SPIE-International Society for Optical Engine] Hardcover May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.86
[Dallas, TX, U.S.A.] [Publication Year: 1995]
Stover, John C.
USD
32.19
ThriftBooks-Atlanta /Abebooks
ISBN10: 0819419346, ISBN13: 9780819419347, [publisher: SPIE-International Society for Optical Engine] Hardcover May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.86
[AUSTELL, GA, U.S.A.] [Publication Year: 1995]
Stover John C.
USD
36.00
Florida Mountain Book Co. /Biblio
Bellingham, WA: SPIE Optical Engineering Press, Date: 1995. Hardcover, [xiii], 321 pages. Good+ condition. Second edition. Size 10.25"x7.25". "Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable." Book has moderate exterior shelfwear, and a small surface tear on the front board cover. Previous owner's name on front fly, text else clean and unmarked.. Good+. 1995. SPIE Optical Engineering Press ISBN 0819419346 9780819419347 [US]
Stover, John C.
USD
36.00
Florida Mountain Book Co. /Abebooks
ISBN10: 0819419346, ISBN13: 9780819419347, [publisher: SPIE Optical Engineering Press, Bellingham, WA] Hardcover Hardcover, [xiii], 321 pages. Good+ condition. Second edition. Size 10.25"x7.25". "Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable." Book has moderate exterior shelfwear, and a small surface tear on the front board cover. Previous owner's name on front fly, text else clean and unmarked.
[Datil, NM, U.S.A.] [Publication Year: 1995]
John C. Stover
USD
41.86
Ergodebooks /Biblio
SPIE Publications, Date: 1995-07-01. Hardcover. Good. 1995. SPIE Publications ISBN 0819419346 9780819419347 [US]
John C. Stover
USD
70.00
Book Deals /Abebooks
ISBN10: 0819419346, ISBN13: 9780819419347, [publisher: SPIE Publications] Hardcover Very Good condition. Shows only minor signs of wear, and very minimal markings inside (if any).
[Tucson, AZ, U.S.A.] [Publication Year: 1995]
John C. Stover
USD
70.00
GF Books, Inc. /Abebooks
ISBN10: 0819419346, ISBN13: 9780819419347, [publisher: SPIE Publications] Hardcover Book is in Used-Good condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear and contain limited notes and highlighting.
[Hawthorne, CA, U.S.A.] [Publication Year: 1995]

DISCLOSURE: When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission at no extra cost to you. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network, Amazon and Alibris.


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