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Hard Cover. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The High Resolution Focused Ion Beams: FIB and its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology.
High Resolution Focused Ion Beams: Fib And Applications by Jon Orloff, Lynwood Swanson , Mark Utlaut , - 2002
by Jon Orloff, Lynwood Swanson , Mark Utlaut ,
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High Resolution Focused Ion Beams: Fib And Applications
by Jon Orloff, Lynwood Swanson , Mark Utlaut ,
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- Hardcover
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Springer, 2002. 1st. Hardcover. Like New/Like New.
- Bookseller DELHI BOOK STORE (IN)
- Format/Binding Hardcover
- Book Condition New Like New
- Jacket Condition Like New
- Quantity Available 1
- Edition 1st
- Binding Hardcover
- ISBN 10 030647350X
- ISBN 13 9780306473500
- Publisher Springer
- Date Published 2002
- Keywords MATERIAL SCIENCE
We have 4 copies available starting at $252.04.
High Resolution Focused Ion Beams: FIB and its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
by Jon Orloff
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780306473500 / 030647350x
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- 504
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High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
by Orloff, Jon; Swanson, Lynwood; Utlaut, Mark
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780306473500 / 030647350X
- Quantity Available
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San Diego, California, United States
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Springer, 2002-10-31. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
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High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
by Orloff, Jon
- New
- Condition
- New
- ISBN 10 / ISBN 13
- 9780306473500 / 030647350x
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- 64
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Victoria, British Columbia, Canada
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Springer. New. Special order direct from the distributor
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Stock Photo: Cover May Be Different
High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
by Orloff, Jon; Swanson, Lynwood; Utlaut, Mark
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780306473500 / 030647350X
- Quantity Available
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campbelltown, Florida, United States
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Springer. Hardcover. New. 9x6x1. Brand New Book in Publishers original Sealing
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