ISBN10: 0306464152, ISBN13: 9780306464157, [publisher: Springer July 2000] Hardcover Front and back covers have very light edge and corner wear. Spine intact with no creasing or warping. Binding is tight and intact, pages clean and unmarked. Firefly sells new and used books through our store front. We try to add a detailed description to as many titles as possible. If you have questions regarding this title, please contact us. Photos available on request.
[Kutztown, PA, U.S.A.] [Publication Year: 2000]
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ISBN10: 0306464152, ISBN13: 9780306464157, [publisher: Springer US] Hardcover Zustand: Sehr gut - Gepflegter, sauberer Zustand. Außen: verschmutzt. Innen: Seiten verschmutzt. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. | Seiten: 260 | Sprache: Englisch
[Trebbin, Germany] [Publication Year: 2000]

ISBN10: 0306464152, ISBN13: 9780306464157, [publisher: Springer US] Hardcover Druck auf Anfrage Neuware - Printed after ordering - The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and ...
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Hard Cover. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The Atom Probe Tomography: Analysis at the Atomic Level. ISBN 0306464152 9780306464157 [GB]