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Our search for Keyword: 9780306442490 ,ISBN: 9780306442490, brought up 20 title(s), showing 1 - 20. 4 removed. Sorting by Price Ascending.
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Barrett C.S Et.Al
author size: 16
USD
34.49
price size: 16
Basi6 International /Abebooks
dealer size: 16
ISBN10: 0306442493, ISBN13: 9780306442490, [publisher: Springer] Hardcover New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
[Irving, TX, U.S.A.] [Publication Year: 1992]
description size: 16
Barrett C. S Et. Al
USD
45.18
Basi6 International via Alibris /Alibris
Springer 1992 Hard cover New, US edition. Satisfaction guaranteed! !
N/A
USD
60.97
Cold Books /Biblio
Springer , pp. 1334 1st Edition . Hardback. Used. Springer ISBN 0306442493 9780306442490 [US]
N/A
USD
61.58
Majestic Books /AbebooksUK
ISBN10: 0306442493, ISBN13: 9780306442490, [publisher: Springer] Hardcover pp. 1334
[Hounslow, United Kingdom] [Publication Year: 1992]
N/A
USD
62.09
Books Puddle /Abebooks
ISBN10: 0306442493, ISBN13: 9780306442490, [publisher: Springer] Hardcover pp. 1334 1st Edition
[New York, NY, U.S.A.] [Publication Year: 1992]
BARRETT CS.; GILFRICH JV.; HUANG TC.; JENKINS R.; MCCARTHY GJ.; PREDECKI PK.; RYON R.; SMITH DK. C. S. J. V. T. C. G. J. P. K. D. K.
USD
63.00
DELHI BOOK STORE /Biblio
Plenum, Date: 1992. 1st. Hardcover. New/New. 1992. Plenum ISBN 0306442493 9780306442490 [IN]
C.S. Barrett
USD
67.63
Amazingbookdeals via Alibris /Alibris
Springer 1992 Hard cover Fine Books In Good Condition. May Have a Small Publisher Mark. Ship Via Fedex. Shipping Time 7 To 10 Days. Bookseller With Over 20 Years In Book Trade.
Barrett, Charles S (Editor), and Gilfrich, John V (Editor), and Huang, Ting C (Editor)
USD
74.05
Media Smart via Alibris /Alibris
Springer 1992 HARDBACK New P 1334 1st Edition.
SMITH
USD
87.48
Basi6 International /Abebooks
ISBN10: 0306442493, ISBN13: 9780306442490, [publisher: Springer] Hardcover New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
[Irving, TX, U.S.A.] [Publication Year: 1992]
Barrett, Charles S (Editor), and Gilfrich, John V (Editor), and Huang, Ting C (Editor)
USD
93.00
Alibris /Alibris
Dordrecht Springer 1992 Hard cover New. Sewn binding. Cloth over boards. Advances in X-Ray Analysis, 35.
Smith
USD
99.96
Basi6 International via Alibris /Alibris
Springer 1992 Hard cover New, US edition. Satisfaction guaranteed! !
Barrett, Charles S (Editor), and Gilfrich, John V (Editor), and Huang, Ting C (Editor)
USD
105.68
Bonita via Alibris /Alibris
Springer 1992 hardcover Good Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Barrett, Charles S (Editor), and Gilfrich, John V (Editor), and Huang, Ting C (Editor)
USD
107.68
ShopSpell via Alibris /Alibris
Dordrecht Springer 1992 Hard cover New. Sewn binding. Cloth over boards. 648 p. Contains: Unspecified. Advances in X-Ray Analysis, 35.
Barrett, Charles S (Editor), and Gilfrich, John V (Editor), and Huang, Ting C (Editor)
USD
116.24
Ria Christie Books via Alibris /Alibris
Dordrecht Springer 1992 Hard cover New. Sewn binding. Cloth over boards. 648 p. Contains: Unspecified. Advances in X-Ray Analysis, 35.
Barrett, Charles S.|Gilfrich, John V.|Huang, Ting C.|Jenkins, Ron|McCarthy, G. J.|Predecki, Paul K.|Ryon, R.|Smith, Deane K.
USD
117.91
moluna /ZVAB
ISBN10: 0306442493, ISBN13: 9780306442490, [publisher: Springer, Berlin] Hardcover Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.
[Greven, Germany] [Publication Year: 1992]
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Barrett, Charles S.|Gilfrich, John V.|Huang, Ting C.|Jenkins, Ron|McCarthy, G. J.|Predecki, Paul K.|Ryon, R.|Smith, Deane K.
USD
131.47
moluna /AbebooksDE
ISBN10: 0306442493, ISBN13: 9780306442490, [publisher: Springer, Berlin] Hardcover Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.
[Greven, Germany] [Publication Year: 1992]
Show/Hide image
N/A
USD
144.12
Mispah books /AbebooksUK
ISBN10: 0306442493, ISBN13: 9780306442490, [publisher: Springer] Hardcover Like New
[Redhill, SURRE, United Kingdom] [Publication Year: 1992]
N/A
USD
156.00
ALLBOOKS1 /Abebooks AUS
ISBN10: 0306442493, ISBN13: 9780306442490, [publisher: Springer] Hardcover
[Salisbury Plain, SA, Australia] [Publication Year: 1992]
Barrett CS.; Gilfrich JV.; Huang TC.; Jenkins R.; McCarthy GJ.; Predecki PK.; Ryon R.; Smith DK. C. S. J. V. T. C. G. J. P. K. D. K.
USD
181.10
Sanctum Books /Biblio
Plenum, Date: 1992. 1st. Hardcover. New. 1992. Plenum ISBN 0306442493 9780306442490 [IN]
Barrett CS.; Gilfrich JV.; Huang TC.; Jenkins R.; McCarthy GJ.; Predecki PK.; Ryon R.; Smith DK. C. S. J. V. T. C. G. J. P. K. D. K.
USD
181.10
BookVistas /Biblio
Plenum, Date: 1992. 1st. Hardcover. New. 1992. Plenum ISBN 0306442493 9780306442490 [IN]

DISCLOSURE: When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission at no extra cost to you. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network, Amazon and Alibris.


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