Home Book reviews Contact

DISCLOSURE: When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission at no extra cost to you. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network, Amazon and Alibris.

Please share to

7 titles, showing 1-7 sort by PRICE ASC.
Please follow us on AddALL Facebook page twitter page
TITLE

SORT

change title size:
AUTHOR

SORT

change author size:
PRICE

DEALER / SITE

SORT

DESCRIPTION

 

change description size:
Gary S. May
author size:
USD
136.80
price size:
The Saint Bookstore /Biblio
dealer size:
Hardback. New. Fundamentals of Semiconductor Manufacturing and Process Control examines in detail the methodology by which electronic materials and supplies are converted into finished integrated circuits, and electronic products in a high-volume manufacturing environment. ISBN 0471784060 9780471784067 [GB]
description size:
Gary S. May
author size:
USD
146.19
price size:
THE SAINT BOOKSTORE /AbebooksUK
dealer size:
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons Inc] Hardcover New copy - Usually dispatched within 4 working days.
[Southport, United Kingdom] [Publication Year: 2006]
description size:
Gary S. May
author size:
USD
160.61
price size:
CitiRetail /AbebooksUK
dealer size:
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons Inc, Chichester] Hardcover First Edition Hardcover. A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and ...
description size:
Gary S. May
author size:
USD
168.39
price size:
Kennys Bookshop and Art Galleries Ltd. /Abebooks
dealer size:
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley and Sons Ltd] Hardcover First Edition Fundamentals of Semiconductor Manufacturing and Process Control examines in detail the methodology by which electronic materials and supplies are converted into finished integrated circuits, and electronic products in a high-volume manufacturing environment. Num Pages: 488 pages, Illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 166 x 25. Weight in Grams: 776. . 2006. 1st Edition. Hardcover. . . . .
[Galway, GY, Ireland] [Publication Year: 2006]
description size:
Gary S. May
author size:
USD
170.26
price size:
Grand Eagle Retail /Abebooks
dealer size:
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons Inc, Chichester] Hardcover First Edition Hardcover. A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and ...
description size:
Gary S. May
author size:
USD
187.79
price size:
AussieBookSeller /Abebooks AUS
dealer size:
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley & Sons Inc, Chichester] Hardcover First Edition Hardcover. A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and ...
description size:
Gary S. May
author size:
USD
205.88
price size:
Kennys Bookstore /Abebooks
dealer size:
ISBN10: 0471784060, ISBN13: 9780471784067, [publisher: John Wiley and Sons Ltd] Hardcover Fundamentals of Semiconductor Manufacturing and Process Control examines in detail the methodology by which electronic materials and supplies are converted into finished integrated circuits, and electronic products in a high-volume manufacturing environment. Num Pages: 488 pages, Illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 166 x 25. Weight in Grams: 776. . 2006. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
[Olney, MD, U.S.A.] [Publication Year: 2006]
description size:

DISCLOSURE: When you use one of our links to make a purchase, we may earn a commission at no extra cost to you.
As an Amazon Associate, AddALL earn commission from qualifying Amazon purchases.


TOO Many Search Results? Refine it!
Exclude: (what you don't want)
Include: (what you want)
Search Results Sort By:
240328012733778695