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Levy RA. R. A.
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USD
41.22
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Zubal Books /Biblio
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Kluwer, Date: 1989. 1000 pp., Paperback, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. 1989. Kluwer ISBN 0792301544 9780792301547 [US]
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R. a. Levy
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USD
619.30
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Ria Christie Collections /Biblio
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New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The Microelectronic Materials and Processes. ISBN 0792301544 9780792301547 [GB]
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Levy RA. R. A.
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USD
642.51
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indianaabooks /Biblio
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Very Good. ISBN 0792301544 9780792301547 [US]
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NATO Advanced Study Institute on Microelectronic Materials and Processes 1986:Il Ciocco Italy/ Levy Roland A. Editor/ North Atlantic Treaty Organization Corporate Author
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USD
712.32
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Revaluation Books /Biblio
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Kluwer Academic Pub, Date: 1989. Paperback. New. 1st edition. 985 pages. 9.20x6.40x1.80 inches. 1989. Kluwer Academic Pub ISBN 0792301544 9780792301547 [GB]
description size:
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Levy, R.A.
author size:
USD
41.22
price size:
Zubal Books via Alibris /Alibris
dealer size:
Kluwer 1989 Trade paperback 1000 pp., Paperback, ex library else text clean and binding tight. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
description size:
Levy, R.A.
author size:
USD
41.22
price size:
Zubal-Books, Since 1961 /Abebooks
dealer size:
ISBN10: 0792301544, ISBN13: 9780792301547, [publisher: Kluwer] Softcover 1000 pp., Paperback, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
[Cleveland, OH, U.S.A.] [Publication Year: 1989]
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Levy, R.A.:
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USD
391.10
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Buchpark /ZVAB
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ISBN10: 0792301544, ISBN13: 9780792301547, [publisher: Springer Netherland] Softcover Gepflegter, sauberer Zustand. Außen: Knick. 3027062/2 Altersfreigabe FSK ab 0 Jahre Softcover reprint of the original 1st ed. 1989.
[Trebbin, Germany] [Publication Year: 1989]
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Levy, R a (Editor)
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USD
422.41
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Ria Christie Books via Alibris /Alibris
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Dordrecht Springer 1989 Trade paperback New. Trade paperback (US). Glued binding. 1000 p. Contains: Unspecified. NATO Science Series E:, 164.
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Levy, R.A.:
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USD
427.84
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Buchpark /AbebooksDE
dealer size:
ISBN10: 0792301544, ISBN13: 9780792301547, [publisher: Springer Netherland] Softcover Gepflegter, sauberer Zustand. Außen: Knick. 3027062/2 Altersfreigabe FSK ab 0 Jahre Softcover reprint of the original 1st ed. 1989.
[Trebbin, Germany] [Publication Year: 1989]
description size:
Levy, R a (Editor)
author size:
USD
516.66
price size:
Alibris /Alibris
dealer size:
Dordrecht Springer 1989 Trade paperback New. Trade paperback (US). Glued binding. 1000 p. Contains: Unspecified. NATO Science Series E:, 164.
description size:
R. A. Levy
author size:
USD
541.41
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AHA-BUCH GmbH /ZVAB
dealer size:
ISBN10: 0792301544, ISBN13: 9780792301547, [publisher: Springer Netherlands] Softcover Druck auf Anfrage Neuware - Printed after ordering - The primary thrust of very large scale integration (VLS!) is the miniaturization of devices to increase packing density, achieve higher speed, and consume lower power. The fabrication of integrated circuits containing in excess of four million components per chip with design rules in the submicron range has now been made possible by the introduction of innovative circuit designs and the development of new microelectronic materials and processes. This book addresses the latter challenge by assessing the current status of the science and technology associated with the production of VLSI silicon circuits. It represents the cumulative effort of experts from academia and industry who have come together to blend their expertise into a tutorial overview and cohesive update of this rapidly expanding field. A balance of fundamental and applied contributions cover the basics of microelectronics materials and process engineering. Subjects in materials science include silicon, silicides, resists, dielectrics, and interconnect metallization. Subjects in process engineering include crystal growth, epitaxy, oxidation, thin film deposition, fine-line lithography, dry etching, ion implantation, and diffusion. Other related topics such as process simulation, defects phenomena, and diagnostic techniques are also included. This book is the result ...
description size:
R. A. Levy
author size:
USD
592.27
price size:
AHA-BUCH GmbH /AbebooksDE
dealer size:
ISBN10: 0792301544, ISBN13: 9780792301547, [publisher: Springer Netherlands] Softcover Druck auf Anfrage Neuware - Printed after ordering - The primary thrust of very large scale integration (VLS!) is the miniaturization of devices to increase packing density, achieve higher speed, and consume lower power. The fabrication of integrated circuits containing in excess of four million components per chip with design rules in the submicron range has now been made possible by the introduction of innovative circuit designs and the development of new microelectronic materials and processes. This book addresses the latter challenge by assessing the current status of the science and technology associated with the production of VLSI silicon circuits. It represents the cumulative effort of experts from academia and industry who have come together to blend their expertise into a tutorial overview and cohesive update of this rapidly expanding field. A balance of fundamental and applied contributions cover the basics of microelectronics materials and process engineering. Subjects in materials science include silicon, silicides, resists, dielectrics, and interconnect metallization. Subjects in process engineering include crystal growth, epitaxy, oxidation, thin film deposition, fine-line lithography, dry etching, ion implantation, and diffusion. Other related topics such as process simulation, defects phenomena, and diagnostic techniques are also included. This book is the result ...
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