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Gao, Wei
author size:
USD
28.88
price size:
text + töne /ZVAB
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer ., London] Hardcover First Edition Gebundene Ausgabe
[Hamburg, HH, Germany] [Publication Year: 2010]
description size:
Gao, Wei
author size:
USD
32.17
price size:
text + töne /AbebooksDE
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer ., London] Hardcover First Edition Gebundene Ausgabe
[Hamburg, HH, Germany] [Publication Year: 2010]
description size:
Wei Gao
author size:
USD
281.64
price size:
Ria Christie Collections /Biblio
dealer size:
Hard Cover. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The Precision Nanometrology : Sensors and Measuring Systems for Nanomanufacturing. ISBN 1849962537 9781849962537 [GB]
description size:
Gao, Wei
author size:
USD
275.58
price size:
Ria Christie Books via Alibris /Alibris
dealer size:
London Springer 2010 Hard cover New. Glued binding. Paper over boards. 354 p. Contains: Unspecified, Line drawings, black & white, Tables, black & white, Figures. Springer Advanced Manufacturing.
description size:
Gao, Wei
author size:
USD
328.09
price size:
Revaluation Books /AbebooksUK
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer Verlag] Hardcover 1st edition. 354 pages. 9.50x6.50x0.75 inches. In Stock.
[Exeter, United Kingdom] [Publication Year: 2010]
description size:
Gao Wei
author size:
USD
322.43
price size:
Revaluation Books /Biblio
dealer size:
Springer Verlag, Date: 2010. Hardcover. New. 1st edition. 354 pages. 9.50x6.50x0.75 inches. 2010. Springer Verlag ISBN 1849962537 9781849962537 [GB]
description size:
Gao
author size:
USD
261.47
price size:
Lucky's Textbooks /Abebooks
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer] Hardcover
[Dallas, TX, U.S.A.] [Publication Year: 2010]
description size:
Gao, Wei
author size:
USD
368.27
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Kennys Bookstore /Abebooks
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer] Hardcover This book describes the latest optical sensors used to measure angle and displacement in precision nanometrology, and presents scanning-type measuring systems for use in surface forms and stage motions. Coverage includes algorithms and experimental data. Series: Springer Series in Advanced Manufacturing. Num Pages: 367 pages, 3 black & white tables, biography. BIC Classification: PDDM; TBN; TDP; TJFM. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 23. Weight in Grams: 713. . 2010. 2010th Edition. Hardcover. . . . . Books ship from the US and Ireland.
[Olney, MD, U.S.A.] [Publication Year: 2010]
description size:
Gao, Wei
author size:
USD
435.29
price size:
Kennys Bookshop and Art Galleries Ltd. /Abebooks
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer] Hardcover This book describes the latest optical sensors used to measure angle and displacement in precision nanometrology, and presents scanning-type measuring systems for use in surface forms and stage motions. Coverage includes algorithms and experimental data. Series: Springer Series in Advanced Manufacturing. Num Pages: 367 pages, 3 black & white tables, biography. BIC Classification: PDDM; TBN; TDP; TJFM. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 23. Weight in Grams: 713. . 2010. 2010th Edition. Hardcover. . . . .
[Galway, GY, Ireland] [Publication Year: 2010]
description size:
Wei Gao
author size:
USD
395.59
price size:
Cold Books /Biblio
dealer size:
Springer , pp. 372 . Hardback. New. Springer ISBN 1849962537 9781849962537 [US]
description size:
Gao, Wei:
author size:
USD
26.68
price size:
Buchpark /ZVAB
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer London] Hardcover Gepflegter, sauberer Zustand. Außen: angestoßen. 6962502/2
[Trebbin, Germany] [Publication Year: 2010]
description size:
Gao, Wei:
author size:
USD
29.71
price size:
Buchpark /AbebooksDE
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer London] Hardcover Gepflegter, sauberer Zustand. Außen: angestoßen. 6962502/2
[Trebbin, Germany] [Publication Year: 2010]
description size:
Gao, Wei
author size:
USD
241.38
price size:
booksXpress /Abebooks
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer] Hardcover
[Bayonne, NJ, U.S.A.] [Publication Year: 2010]
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description size:
Gao, Wei
author size:
USD
257.33
price size:
booksXpress via Alibris /Alibris
dealer size:
London Springer 2010 Hard cover New. Glued binding. Paper over boards. 354 p. Contains: Unspecified, Line drawings, black & white, Tables, black & white, Figures. Springer Advanced Manufacturing.
description size:
Wei Gao
author size:
USD
406.66
price size:
Books Puddle /Abebooks
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer] Hardcover pp. 372
[New York, NY, U.S.A.] [Publication Year: 2010]
description size:
Gao, Wei
author size:
USD
234.84
price size:
Alibris /Alibris
dealer size:
London Springer 2010 Hard cover New. Glued binding. Paper over boards. 354 p. Contains: Unspecified, Line drawings, black & white, Tables, black & white, Figures. Springer Advanced Manufacturing.
description size:
Wei Gao
author size:
USD
238.21
price size:
AHA-BUCH GmbH /ZVAB
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer London] Hardcover Druck auf Anfrage Neuware - Printed after ordering - Precision Nanometrology describes the new field of precision nanometrology, which plays an important part in nanoscale manufacturing of semiconductors, optical elements, precision parts and similar items. It pays particular attention to the measurement of surface forms of precision workpieces and to stage motions of precision machines.The first half of the book is dedicated to the description of optical sensors for the measurement of angle and displacement, which are fundamental quantities for precision nanometrology. The second half presents a number of scanning-type measuring systems for surface forms and stage motions. The systems discussed include:- error separation algorithms and systems for measurement of straightness and roundness,- the measurement of micro-aspherics,- systems based on scanning probe microscopy, and- scanning image-sensor systems.Precision Nanometrology presents the fundamental and practical technologies of precision nanometrology with a helpful selection of algorithms, instruments and experimental data. It will be beneficial for researchers, engineers and postgraduate students involved in precision engineering, nanotechnology and manufacturing.
[Einbeck, Germany] [Publication Year: ...
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description size:
Wei Gao
author size:
USD
265.30
price size:
AHA-BUCH GmbH /AbebooksDE
dealer size:
ISBN10: 1849962537, ISBN13: 9781849962537, [publisher: Springer London] Hardcover Druck auf Anfrage Neuware - Printed after ordering - Precision Nanometrology describes the new field of precision nanometrology, which plays an important part in nanoscale manufacturing of semiconductors, optical elements, precision parts and similar items. It pays particular attention to the measurement of surface forms of precision workpieces and to stage motions of precision machines.The first half of the book is dedicated to the description of optical sensors for the measurement of angle and displacement, which are fundamental quantities for precision nanometrology. The second half presents a number of scanning-type measuring systems for surface forms and stage motions. The systems discussed include:- error separation algorithms and systems for measurement of straightness and roundness,- the measurement of micro-aspherics,- systems based on scanning probe microscopy, and- scanning image-sensor systems.Precision Nanometrology presents the fundamental and practical technologies of precision nanometrology with a helpful selection of algorithms, instruments and experimental data. It will be beneficial for researchers, engineers and postgraduate students involved in precision engineering, nanotechnology and manufacturing.
[Einbeck, Germany] [Publication Year: ...
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