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26.53
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booksXpress /Abebooks
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ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Springer] Hardcover
[Bayonne, NJ, U.S.A.] [Publication Year: 2001]
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Chabal, Yves J.
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USD
207.09
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Mispah books /AbebooksUK
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ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Springer] Hardcover Like New
[Redhill, SURRE, United Kingdom] [Publication Year: 2001]
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Yves J. Chabal
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USD
28.07
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Revaluation Books via Alibris /Alibris
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Springer Verlag 2001 2001 ed. Hardcover New 1st edition. 273 pages. 9.25x6.00x0.50 inches.
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USD
136.32
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Book Deals /Abebooks
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ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Springer] Hardcover Very Good condition. Shows only minor signs of wear, and very minimal markings inside (if any).
[Tucson, AZ, U.S.A.] [Publication Year: 2001]
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USD
130.39
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Books Unplugged /Abebooks
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ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Springer] Hardcover Buy with confidence! Book is in good condition with minor wear to the pages, binding, and minor marks within
[Amherst, NY, U.S.A.] [Publication Year: 2001]
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N/A
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USD
136.31
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GF Books, Inc. /Abebooks
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ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Springer] Hardcover Book is in NEW condition.
[Hawthorne, CA, U.S.A.] [Publication Year: 2001]
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Yves Jean Chabal
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USD
144.82
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The Saint Bookstore /Biblio
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Hardback. New. Discusses silicon oxidation in a tutorial fashion from both experimental and theoretical viewpoints. The authors report on the state of the art both at Lucent Technology and in academic research. The book will appeal to researchers and advanced students. ISBN 354041682x 9783540416821 [GB]
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Yves J. Chabal Editor
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USD
209.68
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Ergodebooks /Biblio
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Springer, Date: 2001-06-15. 2001. Hardcover. Used:Good. 2001. Springer ISBN 354041682X 9783540416821 [US]
description size:
Yves J. Chabal
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USD
19.14
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Revaluation Books /Biblio
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Springer Verlag, Date: 2001. Hardcover. New. 1st edition. 273 pages. 9.25x6.00x0.50 inches. 2001. Springer Verlag ISBN 354041682X 9783540416821 [GB]
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Chabal, Yves J. (Ed.)
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USD
17.63
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Antiquariat im Hufelandhaus GmbH vormals Lange & Springer /AbebooksDE
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ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Berlin/Heidelberg/New York/Barcelona/Hong Kong/London/Milan/Paris/Singapore/Tokyo, Springer.] Hardcover 24 cm. 147 figs., 21 in color, XIII, 260 p. Hardcover Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Springer series in materials science ; 46 Physics and astronomy online library Sprache: Englisch.
[Berlin, Germany] [Publication Year: 2001]
description size:
Chabal, Yves J. (Ed.)
author size:
USD
17.63
price size:
Gast & Hoyer GmbH /AbebooksDE
dealer size:
ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Berlin/Heidelberg/New York/Barcelona/Hong Kong/London/Milan/Paris/Singapore/Tokyo, Springer.] Hardcover 24 cm. 147 figs., 21 in color, XIII, 260 p. Hardcover Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Springer series in materials science ; 46 Physics and astronomy online library Sprache: Englisch.
[Berlin, B, Germany] [Publication Year: 2001]
description size:
Chabal, Yves J. (Ed.)
author size:
USD
16.00
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Antiquariat im Hufelandhaus GmbH vormals Lange & Springer /ZVAB
dealer size:
ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Berlin/Heidelberg/New York/Barcelona/Hong Kong/London/Milan/Paris/Singapore/Tokyo, Springer.] Hardcover 24 cm. 147 figs., 21 in color, XIII, 260 p. Hardcover Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Springer series in materials science ; 46 Physics and astronomy online library Sprache: Englisch.
[Berlin, Germany] [Publication Year: 2001]
description size:
Chabal, Yves J. (Ed.)
author size:
USD
16.00
price size:
Gast & Hoyer GmbH /ZVAB
dealer size:
ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Berlin/Heidelberg/New York/Barcelona/Hong Kong/London/Milan/Paris/Singapore/Tokyo, Springer.] Hardcover 24 cm. 147 figs., 21 in color, XIII, 260 p. Hardcover Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Springer series in materials science ; 46 Physics and astronomy online library Sprache: Englisch.
[Berlin, B, Germany] [Publication Year: 2001]
description size:
Chabal, Yves J (Editor)
author size:
USD
103.32
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Alibris /Alibris
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Berlin, Heidelberg Springer 2001 2001 ed. Hard cover New. Sewn binding. Cloth over boards. 262 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, black & white. Springer Materials Science, 46.
description size:
Yves J. Chabal
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USD
120.57
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AHA-BUCH GmbH /AbebooksDE
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ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Springer Berlin Heidelberg] Softcover Druck auf Anfrage Neuware - Printed after ordering - The idea for a book dealing specifically with elementary processes in silicon oxidation was formulated after a stimulating symposium that I organized at the American Physical Society meeting in March, 1998. The symposium, en titled 'Dynamics of silicon etching and oxidation', explored the mechanisms governing silicon oxidation. With three experimental talks (Hines, Weldon and Gibson) and two theoretical presentations (Pasquarello and Pantelides), it provided a good cross-section of the recent efforts to characterize the in terfacial region of silicon oxide grown on silicon. The novelty of this work comes from the present experimental and theo retical advances that allow the investigation of the formation of ultra-thin silicon oxides. Although structural characterization of bulk silicon oxides and electrical characterization of thin oxides and their interfaces with silicon have produced an extensive body of work over more than forty years, a mechanis tic understanding of the initial oxidation processes has remained elusive. In the past, both the experimental and theoretical efforts have been thwarted by the complexity of dealing with the formation of a mostly amorphous oxide on a crystalline substrate. In this book we present a survey of the state-of-the-art methods, both ex perimental and theoretical, ...
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Yves J. Chabal
author size:
USD
109.42
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AHA-BUCH GmbH /ZVAB
dealer size:
ISBN10: 354041682X, ISBN13: 9783540416821, [publisher: Springer Berlin Heidelberg] Softcover Druck auf Anfrage Neuware - Printed after ordering - The idea for a book dealing specifically with elementary processes in silicon oxidation was formulated after a stimulating symposium that I organized at the American Physical Society meeting in March, 1998. The symposium, en titled 'Dynamics of silicon etching and oxidation', explored the mechanisms governing silicon oxidation. With three experimental talks (Hines, Weldon and Gibson) and two theoretical presentations (Pasquarello and Pantelides), it provided a good cross-section of the recent efforts to characterize the in terfacial region of silicon oxide grown on silicon. The novelty of this work comes from the present experimental and theo retical advances that allow the investigation of the formation of ultra-thin silicon oxides. Although structural characterization of bulk silicon oxides and electrical characterization of thin oxides and their interfaces with silicon have produced an extensive body of work over more than forty years, a mechanis tic understanding of the initial oxidation processes has remained elusive. In the past, both the experimental and theoretical efforts have been thwarted by the complexity of dealing with the formation of a mostly amorphous oxide on a crystalline substrate. In this book we present a survey of the state-of-the-art methods, both ex perimental and theoretical, ...
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